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In-Situ Characterization of Stress Development in Gelatin Film During Controlled Drying

Published online by Cambridge University Press:  10 February 2011

Mengcheng Lu ,
Siu-Yue Tam ,
P. Randall Schunk  and
C. Jeffrey Brinker
Mengcheng Lu
Affiliation:
Advanced Materials Laboratory, Sandia National Laboratories and the University of New Mexico/NSF Center for Micro-Engineering Materials, 1001 University Blvd. SE, Albuquerque, NM 87106, lumc@unm.edu
Siu-Yue Tam
Affiliation:
Advanced Materials Laboratory, Sandia National Laboratories and the University of New Mexico/NSF Center for Micro-Engineering Materials, 1001 University Blvd. SE, Albuquerque, NM 87106, lumc@unm.edu
P. Randall Schunk
Affiliation:
Sandia National Lab, Albuquerque, NM 87185, cjbrink@sandia.gov
C. Jeffrey Brinker
Affiliation:
Advanced Materials Laboratory, Sandia National Laboratories and the University of New Mexico/NSF Center for Micro-Engineering Materials, 1001 University Blvd. SE, Albuquerque, NM 87106, lumc@unm.edu Sandia National Lab, Albuquerque, NM 87185, cjbrink@sandia.gov
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Abstract

Drying of gelatin films was studied by an in-situ cantilever beam method combined with spectroscopic ellipsometry, enabling measurement of the stress development, film shrinkage and compositional change during the drying process. Experiments are carried out under different drying conditions (such as drying extent variation, drying rate variation). The film experiences stress relaxation that indicates visco-elastic relaxation or plastic deformation happened during drying process. Plastic deformation is verified by carefully reversing the drying process, however, the plastic deformation accompanied by visco-elastic relaxation complicates the case of finding the value of the yield stress.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 594: Symposium V – Thin Films - Stresses & Mechanical Properties VIII , 1999 , 263
Copyright
Copyright © Materials Research Society 2000

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References

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