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X-Ray Production Cross Sections for Ti, Co, Ge, Rb and Sn by 16 - 44 Mev Oxygen Ion Bombardment*†

Published online by Cambridge University Press:  06 March 2019

R. F. Chaturvedi ,
J. L. Duggan ,
T. J. Gray ,
C. C. Sachtleben  and
J. Lin
R. F. Chaturvedi
Affiliation:
T. W. Bonner Nuclear Laboratories, Houston, Texas
J. L. Duggan
Affiliation:
Oak Ridge Associated Universities, Oak Ridge, Tennessee
T. J. Gray
Affiliation:
North Texas State University, Denton, Texas
C. C. Sachtleben
Affiliation:
Hastings College, Hastings, Nebraska
J. Lin
Affiliation:
Tennessee Technological University, Cookeville, Tennessee
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Abstract

Absolute K-shell ionization cross sections were measured for Ti, Co, Ge, Rb, and Sn for incident oxygen ions from 16-44 MeV. The x-rays were measured with a high resolution Si(Li) detector (166 eV at 5.9 keV). All of the data represents cross section measurements for thin targets. The measured cross sections for these elements are compared to the theoretical predictions of the Binary Encounter Approximation (BEA). Kα/Kβ ratios and energy shifts were also extracted from the data. The experimental data are compared to measured cross sections for other elements to give an overview of the systematics for oxygen ion induced x-ray production cross sections in this energy range. Some comment will also be given in regard to the use of oxygen ions to measure the parameters associated with ion implanted semiconductors.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 17: Twenty-Second Annual Conference on Applications of X-ray Analysis, August 22-24, 1973 , 1973 , pp. 445 - 456
Copyright
Copyright © International Centre for Diffraction Data 1973

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Footnotes

**

On leave from the State University of New York at Cortland, New York

*

Experiments were performed on the Tandem VandeGraaff Accelerator at the Oak Ridge National Laboratory, Oak Ridge, Tennessee

†

Travel funds were provided by the U.S.A.E.C.

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