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PbTiO3 Thin Films by Chemical Beam Deposition

Published online by Cambridge University Press:  16 February 2011

A.I. Kingon
Affiliation:
Department of Materials Science & Engineering, North Carolina State University, Raleigh, North Carolina, 27695.
K.Y. Hsieh
Affiliation:
Department of Materials Science & Engineering, North Carolina State University, Raleigh, North Carolina, 27695.
L.L.H. King
Affiliation:
Department of Materials Science & Engineering, North Carolina State University, Raleigh, North Carolina, 27695.
S.H. Rou
Affiliation:
Department of Materials Science & Engineering, North Carolina State University, Raleigh, North Carolina, 27695.
K.J. Bachmann
Affiliation:
Department of Materials Science & Engineering, North Carolina State University, Raleigh, North Carolina, 27695.
R.F. Davis
Affiliation:
Department of Materials Science & Engineering, North Carolina State University, Raleigh, North Carolina, 27695.
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Abstract

The feasibility of chemical beam deposition of PbTiO3 thin films is demonstrated. The method utilizes chemical (molecular) beams of metalorganic precursors in a high vacuum chamber. Pyrolysis reactions of the metalorganics at the substrate surface are facilitated by presence of active oxygen from an ozone source. Fine grained, smooth polycrystalline PbTiO3 films have been deposited at substrate temperatures as low as 325°C.

Type
Research Article
Copyright
Copyright © Materials Research Society 1990

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References

REFERENCES

1. Scott, J.E. et. al., Science, 246 Dec. '89, p.1400 Google Scholar
2. Geideman, W.A., Wu, S.Y., and Zuleeg, R., in Digest of Papers, 1989 Government Microcircuit Applications Conference (Department of Defense, Washington, D.C., 1989), p.543.Google Scholar
3. Evans, J.T. and Womack, R., IEEE J. Solid-State Circ. 23, 1171 (1988).Google Scholar
4. Eaton, S.S., Butler, D.B., Parris, M., Wilson, D., and McNeillie, H., in Digest of Technical Papers, IEEE INTERNATIONAL Solid- State. Circuits Conference 1988 (Lewis Winner, Coral Gables, Florida, 1988), p. 130.Google Scholar
5. Bade, J.P. et. al., J. Vac. Sci. Tech. B 8(2), Mar/Apr 1990, p.327.Google Scholar
6. Rou, S.H., Hren, P.D., Kingon, A.I., Proceedings from the MRS Spring 1990 meeting, San Francisco, CA.Google Scholar