3 results
Micro-Raman characterization of Ge diffusion and Si stress change in thin epitaxial Si1−xGex layers on Si(100) after rapid thermal annealing
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- Journal:
- Journal of Materials Research / Volume 27 / Issue 9 / 14 May 2012
- Published online by Cambridge University Press:
- 03 April 2012, pp. 1314-1323
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- 14 May 2012
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The effect of carbon impurities on lightly doped MOCVD GaN Schottky diodes
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- Journal:
- Journal of Materials Research / Volume 26 / Issue 23 / 14 December 2011
- Published online by Cambridge University Press:
- 23 November 2011, pp. 2895-2900
- Print publication:
- 14 December 2011
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Defect-mediated ferromagnetism and controlled switching characteristics in ZnO
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- Journal:
- Journal of Materials Research / Volume 26 / Issue 10 / 28 May 2011
- Published online by Cambridge University Press:
- 11 May 2011, pp. 1298-1308
- Print publication:
- 28 May 2011
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