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Strain Analysis of Si by FEM and Energy-Filtering CBED
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue 1 / February 2002
- Published online by Cambridge University Press:
- 28 March 2002, pp. 11-15
- Print publication:
- February 2002
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A New Electron-Optical Mode for High Contrast Imaging and Online Stereo Observation in TEM
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- Journal:
- Microscopy and Microanalysis / Volume 2 / Issue 3 / June 1996
- Published online by Cambridge University Press:
- 08 August 2003, pp. 137-146
- Print publication:
- June 1996
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