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Calculation of the Surface Excitation Parameter for Si and Ge from Measured Electron Backscattered Spectra by Means of a Monte-Carlo Simulation
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue 4 / August 2003
- Published online by Cambridge University Press:
- 01 August 2003, pp. 343-348
- Print publication:
- August 2003
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Application of Factor Analysis and Artificial Neural Network in Electron Spectroscopic Depth Profiling
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- Journal:
- Microscopy and Microanalysis / Volume 2 / Issue 1 / February 1996
- Published online by Cambridge University Press:
- 30 July 2003, pp. 35-41
- Print publication:
- February 1996
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