5 results
Time Resolved SEM-SXES Analysis for Lithium Material
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 68-70
- Print publication:
- August 2020
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Characterization of Si Surface by SEM-SXES using Low Incident Voltage
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1062-1063
- Print publication:
- August 2018
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The Study of “Window-less” EDS Detector With Low Voltage FE-SEM
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 640-641
- Print publication:
- July 2016
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Automatic Determination of Tight-Binding Parameters in Bulk Systems
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1523 / 2013
- Published online by Cambridge University Press:
- 23 April 2013, mrsf12-1523-qq06-08
- Print publication:
- 2013
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The effect of pad conditioning on planarization characteristics of chemical mechanical polishing (CMP) with ceria slurry
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- Journal:
- MRS Online Proceedings Library Archive / Volume 867 / 2005
- Published online by Cambridge University Press:
- 01 February 2011, W3.5
- Print publication:
- 2005
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