4 results
Strain Characterization of Advanced CMOS Transistors: An Industry Perspective
-
- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 974-975
- Print publication:
- August 2018
-
- Article
-
- You have access
- Export citation
Effects of Silicon Doping and Threading Dislocation Density on Stress Evolution in AlGaN Films
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 1396 / 2012
- Published online by Cambridge University Press:
- 08 February 2012, mrsf11-1396-o06-02
- Print publication:
- 2012
-
- Article
- Export citation
Stress and Microstructure Evolution in Compositionally Graded Al1-xGaxN Buffer Layers for GaN Growth on Si
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 892 / 2005
- Published online by Cambridge University Press:
- 01 February 2011, 0892-FF02-02
- Print publication:
- 2005
-
- Article
- Export citation
Investigation of a New Type of Al3Ti-Based Ll2 Alloy With Second Phase Precipitation
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 364 / 1994
- Published online by Cambridge University Press:
- 22 February 2011, 1083
- Print publication:
- 1994
-
- Article
- Export citation