8 results
X-ray powder diffraction data for indium nitride
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- Journal:
- Powder Diffraction / Volume 14 / Issue 4 / December 1999
- Published online by Cambridge University Press:
- 10 January 2013, pp. 258-260
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On the lattice parameter and thermal expansion coefficient of Silicon [Comments on the paper “Influence of thermal expansion on the lattice parameter of silicon,” F. Liu, Powder Diffr. 9, 260–264 (1994)]
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- Powder Diffraction / Volume 10 / Issue 3 / September 1995
- Published online by Cambridge University Press:
- 10 January 2013, pp. 223-224
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Powder diffraction data of semimagnetic semiconductors Hg0.80Mn0.20S, Hg0.89Fe0.11S and Hg0.98Co0.02S
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- Powder Diffraction / Volume 15 / Issue 2 / June 2000
- Published online by Cambridge University Press:
- 10 January 2013, pp. 116-119
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LCBASE: Program and database for phase identification
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- Powder Diffraction / Volume 9 / Issue 2 / June 1994
- Published online by Cambridge University Press:
- 10 January 2013, pp. 136-142
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X-ray powder diffraction data for bulk Zn1−xMgxSe crystals
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- Powder Diffraction / Volume 13 / Issue 1 / March 1998
- Published online by Cambridge University Press:
- 10 January 2013, pp. 50-55
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Rietveld refinement for indium nitride in the 105–295 K range
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- Powder Diffraction / Volume 18 / Issue 2 / June 2003
- Published online by Cambridge University Press:
- 06 March 2012, pp. 114-121
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Powder diffraction study of LiCu2O2 crystals
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- Powder Diffraction / Volume 16 / Issue 1 / March 2001
- Published online by Cambridge University Press:
- 05 March 2012, pp. 30-36
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Crystal structure of magnesium chromium vanadate Mg2CrV3O11, a member of the A2BV3O11 vanadate family
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- Journal:
- Powder Diffraction / Volume 22 / Issue 3 / September 2007
- Published online by Cambridge University Press:
- 01 March 2012, pp. 246-252
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