28 results
Simultaneous Voltage and Laser Pulsing in Atom Probe Tomography
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 718-720
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- August 2022
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Fully Automated Data Acquisition and Reporting for Semiconductor Dopant Analysis
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 726-727
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- August 2022
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New Product Announcement – LEAP 6000XR, New Applications, New Performance
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 3190-3191
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- August 2022
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Deep-Ultra-Violet Atom-Probe Tomography Using Automation to Understand Operational Parameter Space: A Progress Report
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, p. 710
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- August 2022
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Site-Specific Lift-Out on Complicated Nanoscale Structures
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 92-93
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- August 2022
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New Product Announcement – Invizo 6000, New Applications, New Performance
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 3188-3189
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- August 2022
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Al2O3 Grain Boundary Segregation in a Thermal Barrier Coating on a Ni-Based Superalloy
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- Microscopy and Microanalysis / Volume 28 / Issue 5 / October 2022
- Published online by Cambridge University Press:
- 13 May 2022, pp. 1453-1462
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- October 2022
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Study of LEAP® 5000 Deadtime and Precision via Silicon Pre-Sharpened-Microtip™ Standard Specimens
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- Microscopy and Microanalysis / Volume 28 / Issue 4 / August 2022
- Published online by Cambridge University Press:
- 28 July 2021, pp. 1019-1037
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- August 2022
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Three-Dimensional Microstructural Characterization of Novel Chalcogenide Nanocomposites for Gradient Refractive Index Applications
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 2500-2501
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- August 2019
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Performance of Ultra-Violet Laser Pulsing with a Wire-Geometry, Moderately Focused Atom Probe System (EIKOS)
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 2550-2551
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- August 2019
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A Nanoscale Record of Impact-Induced Pb Mobility in Lunar Zircon
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 2448-2449
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- August 2019
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A Study of Parameters Affecting Atom Probe Tomography Specimen Survivability
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- Microscopy and Microanalysis / Volume 25 / Issue 2 / April 2019
- Published online by Cambridge University Press:
- 05 November 2018, pp. 425-437
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- April 2019
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Understanding Conditions Affecting Background in Atom Probe Tomography with Implications for Analysis of Hydrogen
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1028-1029
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- August 2018
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Grain Boundary Analysis of Inconel 718 Using a Novel Atom Probe Design
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
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- 01 August 2018, pp. 2212-2213
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- August 2018
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Three-Dimensional Nanoscale Mapping of State-of-the-Art Field-Effect Transistors (FinFETs)
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- Microscopy and Microanalysis / Volume 23 / Issue 5 / October 2017
- Published online by Cambridge University Press:
- 31 August 2017, pp. 916-925
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- October 2017
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Automated Crystallographic Identification of Atom Probe's Ion Desorption Map
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 662-663
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- July 2017
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Hardware and Software Advances in Commercially Available Atom Probe Tomography Systems
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 40-41
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- July 2017
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Applications, Technical Challenges, and Recent Implementation of a UHV/Cryogenic Specimen Transfer System for Atom Probe Tomography
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 622-623
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- July 2017
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Atom Probe Tomography and analytical Scanning Transmission Electron Microscopy of Rapid Solidification Microstructures in Al-Cu Alloy Thin Films
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 688-689
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- July 2017
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Evolution of Atom Probe Data Collection Toward Optimized and Fully Automated Acquisition
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 616-617
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- July 2017
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