Hostname: page-component-848d4c4894-8kt4b Total loading time: 0 Render date: 2024-07-04T17:30:38.314Z Has data issue: false hasContentIssue false

Site-Specific Lift-Out on Complicated Nanoscale Structures

Published online by Cambridge University Press:  22 July 2022

Yimeng Chen*
Affiliation:
CAMECA Instruments Inc., Madison, WI 53711 USA
Ty J. Prosa
Affiliation:
CAMECA Instruments Inc., Madison, WI 53711 USA
*
*Corresponding author: Yimeng.Chen@ametek.com

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
On Demand - Advances in Focused Ion Beam Instrumentation, Applications and Techniques in Materials and Life Sciences
Copyright
Copyright © Microscopy Society of America 2022

References

Thompson, K. et al. , Ultramicroscopy 107 (2007), p.131.CrossRefGoogle Scholar
Miller, M. K. et al. , Microsc. Microanal. 13 (2007), p.428.CrossRefGoogle Scholar
Lawrence, D. et al. , Microsc. Microanal. 14 (S2) (2008), p.1004.CrossRefGoogle Scholar
Prosa, T. J. and Larson, D. J., Microsc. Microanal. 23 (2017), p.194.CrossRefGoogle Scholar
Thompson, K. et al. , Microsc. Microanal. 12 (2006), p.1736CD.CrossRefGoogle Scholar