5 results
D-1 Invited—Long Range Scans and Many-Beam Effects for High-Resolution X-ray Diffraction From Multilayered Structures
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- Journal:
- Powder Diffraction / Volume 23 / Issue 2 / June 2008
- Published online by Cambridge University Press:
- 20 May 2016, p. 174
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C-7 Synchrotron-Based Radioscopy with Spatio-Temporal Micro-Resolution Using Hard X-rays
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- Journal:
- Powder Diffraction / Volume 24 / Issue 2 / June 2009
- Published online by Cambridge University Press:
- 20 May 2016, p. 168
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X-ray diffraction imaging for predictive metrology of crack propagation in 450-mm diameter silicon wafers
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- Journal:
- Powder Diffraction / Volume 28 / Issue 2 / June 2013
- Published online by Cambridge University Press:
- 19 April 2013, pp. 95-99
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X-ray diffraction imaging of dislocation generation related to microcracks in Si wafers
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- Journal:
- Powder Diffraction / Volume 25 / Issue 2 / June 2010
- Published online by Cambridge University Press:
- 29 February 2012, pp. 99-103
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X-Ray Diffraction and Reflectivity Studies of Thin Porous Silicon Layers
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- Journal:
- MRS Online Proceedings Library Archive / Volume 452 / 1996
- Published online by Cambridge University Press:
- 15 February 2011, 437
- Print publication:
- 1996
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