11 results
Simultaneous High-Speed DualEELS and EDS acquisition at atomic level across the LaFeO3 / SrTiO3 interface
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1857-1858
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- August 2015
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Simultaneous High-Speed DualEELS and EDS Acquisition at Atomic Level
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 128-129
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- August 2014
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Capturing irreversible reactions with nanosecond-scale dynamic TEM movies: measuring crystal growth rates during laser annealing of phase change materials
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1156-1157
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- August 2013
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In situ TEM of instabilities in capped liquid films: capturing the early stages of morphological development with nanosecond-scale dynamic TEM
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 444-445
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- August 2013
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Nanosecond-scale imaging of laser-induced crystallization of GeTe
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 604-605
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- July 2012
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Latest Developments in Dynamic TEM: Revealing Material Processes at Nanometer and Nanosecond Scales
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 596-597
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- July 2012
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Single-Shot Dynamic Transmission Electron Microscopy: Present and Future
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 482-483
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- August 2008
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Endotaxial Growth Mechanisms of Sn Quantum Dots in Si Matrix
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- MRS Online Proceedings Library Archive / Volume 770 / 2003
- Published online by Cambridge University Press:
- 10 February 2011, I1.7
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- 2003
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Atomic Scale Structural Analysis of Sn-Si Quantum Dots
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 November 2002, pp. 1114-1115
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- August 2002
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Characterization of the Source/Drain Region in Mos Devices by Scanning Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
- Published online by Cambridge University Press:
- 02 July 2020, pp. 210-211
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- August 2001
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Quantification of Compositional Modulations in Self-Assembled Multisheet (Cd, Zn, Mn)Se Quantum Dot Structures
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- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
- Published online by Cambridge University Press:
- 02 July 2020, pp. 202-203
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- August 2001
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