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Atomic Scale Structural Analysis of Sn-Si Quantum Dots

Published online by Cambridge University Press:  01 November 2002

Y. Lei ,
P. Möck ,
T. Topuria ,
N. D. Browning ,
R. Ragan  and
H. A. Atwater
Y. Lei
Affiliation:
Dept. of Physics, University of Illinois at Chicago, 845 W. Taylor St., Chicago, IL 60607, USA
P. Möck
Affiliation:
Dept. of Physics, University of Illinois at Chicago, 845 W. Taylor St., Chicago, IL 60607, USA
T. Topuria
Affiliation:
Dept. of Physics, University of Illinois at Chicago, 845 W. Taylor St., Chicago, IL 60607, USA
N. D. Browning
Affiliation:
Dept. of Physics, University of Illinois at Chicago, 845 W. Taylor St., Chicago, IL 60607, USA
R. Ragan
Affiliation:
Thomas J. Watson Laboratory of Applied Physics, California Institute of Technology, MS 128-95, Pasadena, CA 91125, USA
H. A. Atwater
Affiliation:
Thomas J. Watson Laboratory of Applied Physics, California Institute of Technology, MS 128-95, Pasadena, CA 91125, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 1114 - 1115
Copyright
Copyright © Microscopy Society of America 2002