31 results
The Influence of Thermal History and Alloying Elements on Temporary Strengthening of Thin Al-Cu Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 594 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 117
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- 1999
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Cu concentration dependence of the mechanical behaviour of Al-Cu alloys
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- MRS Online Proceedings Library Archive / Volume 564 / 1999
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- 10 February 2011, 477
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- 1999
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In-Situ Characterisation of Precipitation in Al-Cu thin films
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- MRS Online Proceedings Library Archive / Volume 564 / 1999
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- 10 February 2011, 471
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- 1999
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In-Situ Characterisation of Precipitation in AI-Cu thin films
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- MRS Online Proceedings Library Archive / Volume 562 / 1999
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- 10 February 2011, 269
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- 1999
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Electromigration and Diffusion in Short Al-Ni-Cr Lines
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- MRS Online Proceedings Library Archive / Volume 516 / January 1998
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- 10 February 2011, 275
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- January 1998
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Comparison of the Performance of Single Wafer and Batch Systems for Identical Processes
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- MRS Online Proceedings Library Archive / Volume 525 / 1998
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- 10 February 2011, 3
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- 1998
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Kinetics of Cu Segregation in Al-Cu(1at% Cu) Interconnects Studied by Resistance Measurements
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- MRS Online Proceedings Library Archive / Volume 473 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 267
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- 1997
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Electromigration and 1/f Noise in Single-Crystalline, Bamboo and Polycrystalline Al Lines
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- MRS Online Proceedings Library Archive / Volume 472 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 307
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- 1997
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Electromigration and 1/ƒ Noise in Single-Crystalline, Bamboo and Polycrystalline Al Lines
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- MRS Online Proceedings Library Archive / Volume 473 / 1997
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- 10 February 2011, 211
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- 1997
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Electromigration in Short Al Lines Studied by High-Resolution Resistance Measurement
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- MRS Online Proceedings Library Archive / Volume 473 / 1997
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- 10 February 2011, 255
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- 1997
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Current Dependence of Reversible Electromigration Induced Resistance Changes in Short Al Lines and Interpretation of Irreversible Effects
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- MRS Online Proceedings Library Archive / Volume 428 / 1996
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- 15 February 2011, 121
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- 1996
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Isothermal Stress Relaxation In Al, AlCu and AlVPd Films
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- MRS Online Proceedings Library Archive / Volume 428 / 1996
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- 15 February 2011, 513
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- 1996
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Single-Crystalline and Bamboo Al Lines Fabricated by Graphoepitaxy: Microstructure and 1/f Noise Measurements
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- MRS Online Proceedings Library Archive / Volume 428 / 1996
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- 15 February 2011, 127
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- 1996
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Isothermal Stress Relaxation in Al, Alcu and A1vpd Films
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- MRS Online Proceedings Library Archive / Volume 436 / 1996
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- 15 February 2011, 443
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- 1996
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Control of the Microstructure of Al Metallization by Graphoepitaxy
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- MRS Online Proceedings Library Archive / Volume 391 / 1995
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- 15 February 2011, 397
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- 1995
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Line Length Dependence of Small, Electromigration Induced Resistance Changes in Aluminum
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- MRS Online Proceedings Library Archive / Volume 391 / 1995
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- 15 February 2011, 507
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- 1995
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I/F Noise Measurements in Al-Si, Al-Si-V and Al-Si-V-Pd Alloy Films
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- MRS Online Proceedings Library Archive / Volume 338 / 1994
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- 22 February 2011, 483
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- 1994
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Time Resolved X-Ray Diffraction Study of the Transformation Kinetics of TiSi2-C49 in Amorphous Si/Ti Multilayers
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- MRS Online Proceedings Library Archive / Volume 311 / 1993
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- 21 February 2011, 269
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- 1993
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Growth Stress in CVD-WGex Films Deposited by Reduction of WF6 by GeH4
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- MRS Online Proceedings Library Archive / Volume 308 / 1993
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- 15 February 2011, 27
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- 1993
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The Influence of Temperature Gradients on Partial Pressures in a Cvd Reactor
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- MRS Online Proceedings Library Archive / Volume 334 / 1993
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- 22 February 2011, 483
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- 1993
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