2 results
Surface imaging with UHV SLEEM and SEM LEEM
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 444-445
- Print publication:
- August 2019
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Calculations of Intensive Electron Source for Electron Beam Welding
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S03 / September 2003
- Published online by Cambridge University Press:
- 05 September 2003, pp. 22-23
- Print publication:
- September 2003
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