11 results
Microstructural and Analytic Characterisation of Li-Ion Batteries by Correlative EDS, SIMS, Light-, Raman-, Ion- and Electron Microscopy
-
- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1756-1757
- Print publication:
- August 2019
-
- Article
-
- You have access
- Export citation
Applications of Focused Ion Beam (FIB) on Yeast Cell & SARS Virus
-
- Journal:
- Microscopy Today / Volume 15 / Issue 5 / September 2007
- Published online by Cambridge University Press:
- 14 March 2018, pp. 42-43
- Print publication:
- September 2007
-
- Article
-
- You have access
- Export citation
Development of an Ion Optical System to transfer Secondary Ions from the Sample to an Ion Trap Mass Spectrometer
-
- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S03 / September 2007
- Published online by Cambridge University Press:
- 07 September 2007, pp. 16-17
- Print publication:
- September 2007
-
- Article
- Export citation
Applications of Focused Ion Beam (FIB) On Yeast Cell and SARS Virus
-
- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1528-1529
- Print publication:
- August 2007
-
- Article
- Export citation
Recent Developments in CrossBeam® Technology
-
- Journal:
- Microscopy Today / Volume 15 / Issue 1 / January 2007
- Published online by Cambridge University Press:
- 14 March 2018, pp. 18-19
- Print publication:
- January 2007
-
- Article
-
- You have access
- Export citation
Investigation of the Interface Between Biological Cell Tissue and Hard Substrate Materials using CrossBeam Technology
-
- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 800-801
- Print publication:
- August 2005
-
- Article
-
- You have access
- Export citation
A Three Beam Approach to TEM Preparation Using In-situ Low Voltage Argon Ion Final Milling in a FIB-SEM Instrument
-
- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 830-831
- Print publication:
- August 2005
-
- Article
-
- You have access
- Export citation
Real time SEM imaging of FIB milling processes for extended accuracy in Cross Sectioning and TEM Preparation
-
- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S03 / September 2003
- Published online by Cambridge University Press:
- 05 September 2003, pp. 524-525
- Print publication:
- September 2003
-
- Article
- Export citation
Focused Ion Beam Preparation Techniques for EFTEM Analysis
-
- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 24 July 2003, pp. 872-873
- Print publication:
- August 2003
-
- Article
-
- You have access
- Export citation
Enhanced Site specific Preparation of SEM Cross Sections and TEM Samples by using CrossBeam Technology
-
- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 546-547
- Print publication:
- August 2002
-
- Article
-
- You have access
- Export citation
Focused Ion Beam Based Sample Preparation Techniques
-
- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 November 2002, pp. 46-47
- Print publication:
- August 2002
-
- Article
-
- You have access
- Export citation