24 results
Applications of Low Dose Electron Ptychography.
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 352-354
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- August 2022
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Focused-Probe STEM Ptychography: Reconstruction Methods, Transfer Functions and Signal-to-Noise
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 488-489
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- August 2018
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Exploring the Limits of Focused-Probe STEM Ptychography
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
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- 01 August 2018, pp. 190-191
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- August 2018
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Evaluation of Aberration-corrected Optical Sectioning for Exploring the Core Structure of ½[111] Screw Dislocations in BCC Metals
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
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- 04 August 2017, pp. 432-433
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- July 2017
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Using Advanced STEM Techniques to Unravel Key Issues in the Development of Next-Generation Nanostructures for Energy Storage
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1698-1699
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- July 2017
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Phase Imaging in STEM Allowing for Post-Acquisition Aberration Correction and 3D Optical Sectioning using Ptychography Wigner-Distribution Deconvolution
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 508-509
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- July 2016
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The Use of Electron Ptychography to Implement Efficient Phase Imaging in STEM
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
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- 25 July 2016, pp. 466-467
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- July 2016
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Quantification of ADF STEM Image Data for Nanoparticle Structure and Strain Measurements
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
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- 25 July 2016, pp. 896-897
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- July 2016
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Design and Testing of a Quadrupole/Octupole C3/C5 Aberration Corrector
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 2130-2131
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- August 2005
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An Aberration-Corrected STEM for Diffraction Studies
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 544-545
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- August 2005
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Materials Applications of Aberration-Corrected STEM
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- Microscopy and Microanalysis / Volume 10 / Issue S03 / August 2004
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- 01 August 2004, pp. 12-13
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- August 2004
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Sub-Ångstrom Resolution through Aberration-Corrected STEM
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- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
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- 24 July 2003, pp. 926-927
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- August 2003
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Ultimate Resolution Limit for ADF-STEM
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- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
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- 16 July 2003, pp. 940-941
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- August 2003
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The Ultimate Resolution in Aberration-Corrected STEM
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 November 2002, pp. 16-17
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- August 2002
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Initial Results from Aberration Correction in STEM
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
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- 01 August 2002, pp. 476-477
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- August 2002
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Nanoscale Structure/Property Correlation Through Aberration-Corrected Stem And Theory
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- MRS Online Proceedings Library Archive / Volume 738 / 2002
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- 11 February 2011, G1.1
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- 2002
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Towards Z-Contrast Imaging in an Aberration-Corrected STEM
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- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
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- 02 July 2020, pp. 106-107
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- August 2000
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Quantitative Interpretation and Information Limits in Annular Dark-Field STEM Images
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- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
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- 02 July 2020, pp. 104-105
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- August 2000
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Z-Contrast Imaging: Quantitative Aspects of the Dynamical Object Function.
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- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 138-139
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- August 2000
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The Atomic-Scale Origins of Grain Boundary Superconducting Properties
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- Microscopy and Microanalysis / Volume 4 / Issue S2 / July 1998
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- 02 July 2020, pp. 688-689
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- July 1998
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