Hostname: page-component-848d4c4894-cjp7w Total loading time: 0 Render date: 2024-06-23T00:59:08.286Z Has data issue: false hasContentIssue false
  • English
  • Français

Towards Z-Contrast Imaging in an Aberration-Corrected STEM

Published online by Cambridge University Press:  02 July 2020

S. J. Pennycook ,
B. Rafferty  and
P. D. Nellist
S. J. Pennycook
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee37831-6030USA.
B. Rafferty
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee37831-6030USA. Cavendish Laboratory, Madingley Road, Cambridge, CB3OHEUK.
P. D. Nellist
Affiliation:
Nanoscale Physics Research Laboratory, School of Physics and Astronomy, The University of Birmingham, Birmingham, B15 2TTUK
Get access

Extract

The demonstration of an aberration corrector for the STEM promises enormous improvements in the contrast and signal to noise ratio of Z-contrast images, with similar benefits for atomic column EELS. Here we show that the limiting resolution for a zone axis crystal will become not the probe, as in the case of isolated atoms, but the Is Bloch states. In fact, the Z-contrast image becomes a direct image of the Is Bloch states with limiting intensities for large thicknesses roughly proportional to Z The potential benefits for the (STEM) appear to far exceed those for the conventional TEM. Some of these benefits are intrinsic to incoherent imaging: the lack of interference artifacts and the potential factor of two improvement in image resolution were first pointed out by Lord Rayleigh. This improved resolution has been demonstrated by the achievement of sub-ingstrom information transfer in the VG Microscopes HB603U, and the resolution advantage will still apply after aberration correction.

Type
The Theory and Practice of Scanning Transmission Electron Microscopy
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 106 - 107
Copyright
Copyright © Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

References:

1.Krivanek, O. L., Delby, N. and Lupini, A.Ultramicroscopy, 78(1999)1CrossRefGoogle Scholar
2.Rafferty, B., Pennycook, S. J. and Nellist, P. D., these proceedingsGoogle Scholar
3.Rayleigh, Lord, Phil. Mag. (5) 42(1896)167CrossRefGoogle Scholar
4.Nellist, P. D. and Pennycook, S. J., Phys. Rev. Lett. 81(1998)4156CrossRefGoogle Scholar
5.Nellist, P. D. and Pennycook, S. J., Ultramicroscopy, 78(1998)111CrossRefGoogle Scholar
6.Pennycook, S. J., Rafferty, B. and Nellist, P. D., Microscopy and Microanalysis, in pressGoogle Scholar
7.Duscher, G., Browning, N. D., and Pennycook, S. J., Phys. Stat. Sol. (a) 166(1998)3273.0.CO;2-R>CrossRefGoogle Scholar
8.Nellist, P. D., and Pennycook, S. J., Science 274(1996)413CrossRefGoogle Scholar
9.Sohlberg, Karl, Pennycook, Stephen J., and Pantelides, Sokrates T., these proceedingsGoogle Scholar
10. Research sponsored by the Division of Materials Sciences, USDOE, under contract DE-AC05-96OR22464 with Lockheed Martin Energy Research Corp., by the Royal Society (London), and by an appointment to the ORNL postdoctoral research program administered jointly by ORNL and ORISE.Google Scholar