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Characterization of Mn oxides using “flank” method in SEM-SXES system
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1770-1771
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- August 2021
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Developing and Applying a Correlative Light and Electron Microscopy Technique to Overcome Inherent Transmission Electron Microscopy Shortcomings.
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1398-1400
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- August 2021
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Time Resolved SEM-SXES Analysis for Lithium Material
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 68-70
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- August 2020
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Preparation of TEM Samples from Specific Orientations Using FIB-SEM
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1224-1225
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- August 2020
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Ultra Low Voltage Reflected Electron Energy Loss Spectroscopy
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
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- 05 August 2019, pp. 442-443
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- August 2019
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Characterization of Si Surface by SEM-SXES using Low Incident Voltage
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1062-1063
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- August 2018
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New Approach for High Quality Cross Sectioning in Tablets using Broad Argon Ion Beam with LN2 Sample Cooling
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1424-1425
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- August 2018
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3D Elemental Mapping by Array Tomography Particle Analysis
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
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- 01 August 2018, pp. 1448-1449
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- August 2018
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Crystal Grain Observation Using a Segmented Backscattered Electron Detector
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
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- 01 August 2018, pp. 686-687
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- August 2018
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New Approaches for high lateral resolution Array Tomography analysis
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1180-1181
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- July 2017
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Correlative Fluorescence and Electron Microscopy in 3D
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
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- 04 August 2017, pp. 1282-1283
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- July 2017
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Advancing Correlative STEM Analysis Methods for FE-SEM
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
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- 04 August 2017, pp. 560-561
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- July 2017
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An Examination of the Surface and Sub-Surface of Modern and Historical Platinum Photographic Prints Using Low Vacuum High-Resolution Scanning Electron Microscopy
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- Microscopy and Microanalysis / Volume 22 / Issue 4 / August 2016
- Published online by Cambridge University Press:
- 26 July 2016, pp. 857-864
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- August 2016
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The Study of “Window-less” EDS Detector With Low Voltage FE-SEM
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
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- 25 July 2016, pp. 640-641
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- July 2016
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The 3D-Structure Analysis of Spermatids in the Seminiferous Epithelia by the Serial Block-Face SEM Method
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 893-894
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- August 2015
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MALDI and LDI Imaging of Forensic Samples by Using A Spiral-Trajectory Ion Optics Time-of-Flight Mass Spectrometer
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 2061-2062
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- August 2015
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Cooling Temperature Control System for the Cross Section Polisher
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
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- 23 September 2015, pp. 151-152
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- August 2015
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New Technology and Approaches for the Acceleration and Enhancement of Microstructural Characterization using Electron Backscatter Diffraction
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1173-1174
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- August 2015
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Thrombus Formation Processes are dependent on Endothelial Injuries: Examined by In vivo Two–photon Molecular Imaging and Laser Manipulation
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1344-1345
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- August 2014
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Ultra Low Voltage Secondary and Backscatter Imaging in FE-SEM - Successes and Challenges
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 20-21
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- August 2014
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