18 results
Development of a High Electron Energy-loss Spectrometry System for Advanced Scanning Transmission Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2644-2647
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- August 2022
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On the Benefit of Aberration Correction in Cryo Electron Microscopy
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 2156-2157
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- August 2020
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Experimental Contrast of Atomically-resolved Cc/Cs-corrected 20-80kVSALVEImages of 2D-objects Matches Calculations
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 894-895
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- July 2016
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Performance of the SALVE-microscope: Atomic-resolution TEM Imaging at 20 kV
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 878-879
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- July 2016
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On Proper Phase Contrast Imaging in Aberration Corrected TEM
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
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- 27 August 2014, pp. 926-927
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- August 2014
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Towards High Resolution in TEM and STEM: What are the Limitations and Achievements
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 378-379
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- August 2014
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Overview of Commercially Available CEOS Hexapole-type Aberration Correctors
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 934-935
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- August 2014
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Some Personal Memories of Otto Scherzer
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- Microscopy Today / Volume 18 / Issue 4 / July 2010
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- 07 July 2010, pp. 34-37
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- July 2010
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Design of an Electron Optical System for the Correction of the Chromatic Aberration Cc of a TEM Objective Lens
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- Microscopy and Microanalysis / Volume 10 / Issue S03 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 2-3
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- August 2004
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Cs Corrector for Imaging
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- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 976-977
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- August 2004
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Electron Holography with Cs-corrected TEM
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- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
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- 01 August 2004, pp. 112-113
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- August 2004
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Electron Holography with Cs-corrected TEM
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- Microscopy and Microanalysis / Volume 10 / Issue S03 / August 2004
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- 01 August 2004, pp. 40-41
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- August 2004
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Cs Corrector for Illumination
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- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 1004-1005
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- August 2004
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State of the First Aberration-Corrected, Monochromized 200kV FEG-TEM
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- Microscopy and Microanalysis / Volume 9 / Issue S03 / September 2003
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- 05 September 2003, pp. 38-39
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- September 2003
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Current and Future Developments in order to Approach a Point Resolution of dpr ~ 0.5 Å with a TEM
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- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 01 August 2003, pp. 930-931
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- August 2003
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State of the first aberration-corrected, monochromized 200kV FEG-TEM
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- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
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- 16 July 2003, pp. 938-939
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- August 2003
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Experimental Set-up of a Purely Electrostatic Monochromator for High Resolution and Analytical Purposes of a 200 KV TEM
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 584-585
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- August 2002
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Realization of a Field Emission Gun with Advanced Köhler Illumination
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 486-487
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- August 2002
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