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18 results

  • On Proper Phase Contrast Imaging in Aberration Corrected TEM
  • Peter Hartel, Martin Linck, Frank Kahl, Heiko Müller, Max Haider
  • Journal: Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
  • Published online by Cambridge University Press: 27 August 2014, pp. 926-927
  • Print publication: August 2014
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  • Some Personal Memories of Otto Scherzer
  • Dieter Typke, Harald Rose, Erich Plies, Max Haider
  • Journal: Microscopy Today / Volume 18 / Issue 4 / July 2010
  • Published online by Cambridge University Press: 07 July 2010, pp. 34-37
  • Print publication: July 2010
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    At last year's M&M meeting, the birth centennial of Otto Scherzer, one of the pioneers of electron optics and particularly the correction of electron-optical lenses, was remembered in a special symposium. His scientific achievements have been extensively described in an article by Marko and Rose (2010). Here we try to recollect some personal memories of Otto Scherzer from the time we spent at the “Institut für theoretische Physik” at the Technische Hochschule Darmstadt (now Technische Universität Darmstadt).

  • Current and Future Developments in order to Approach a Point Resolution of dpr ~ 0.5 Å with a TEM
  • Max. Haider
  • Journal: Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
  • Published online by Cambridge University Press: 01 August 2003, pp. 930-931
  • Print publication: August 2003
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