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At last year's M&M meeting, the birth centennial of Otto Scherzer, one of the pioneers of electron optics and particularly the correction of electron-optical lenses, was remembered in a special symposium. His scientific achievements have been extensively described in an article by Marko and Rose (2010). Here we try to recollect some personal memories of Otto Scherzer from the time we spent at the “Institut für theoretische Physik” at the Technische Hochschule Darmstadt (now Technische Universität Darmstadt).
Extended abstract of a paper presented at the Pre-Meeting Congress: Materials Research in an Aberration-Free Environment, at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, July 31 and August 1, 2004.
Extended abstract of a paper presented at the Pre-Meeting Congress: Materials Research in an Aberration-Free Environment, at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, July 31 and August 1, 2004.
We have calculated the height-height correlation function by means of Monte Carlo simulations of a solid-on-solid model. These simulations reveal that the position and sizes of the islands formed during the first half-monolayer are highly correlated, a feature which has also been noted in recent x-ray studies of growth by OMCVD. This morphology results in the emergence of a characteristic length, ℓ, in the correlation function, which is found to obey the scaling law ℓ = (D)/J)γ, where D is the diffusion length, and J is the deposition flux. The value of the exponent γ varies with coverage and depends on the growth conditions.
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