18 results
Development of a High Electron Energy-loss Spectrometry System for Advanced Scanning Transmission Electron Microscopy
- Journal: Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press: 22 July 2022, pp. 2644-2647
- Print publication: August 2022
-
- Article
-
- You have access
- Export citation
On the Benefit of Aberration Correction in Cryo Electron Microscopy
- Journal: Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press: 30 July 2020, pp. 2156-2157
- Print publication: August 2020
-
- Article
-
- You have access
- Export citation
Experimental Contrast of Atomically-resolved Cc/Cs-corrected 20-80kVSALVEImages of 2D-objects Matches Calculations
- Journal: Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press: 25 July 2016, pp. 894-895
- Print publication: July 2016
-
- Article
-
- You have access
- Export citation
Performance of the SALVE-microscope: Atomic-resolution TEM Imaging at 20 kV
- Journal: Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press: 25 July 2016, pp. 878-879
- Print publication: July 2016
-
- Article
-
- You have access
- Export citation
On Proper Phase Contrast Imaging in Aberration Corrected TEM
- Journal: Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press: 27 August 2014, pp. 926-927
- Print publication: August 2014
-
- Article
-
- You have access
- Export citation
Towards High Resolution in TEM and STEM: What are the Limitations and Achievements
- Journal: Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press: 27 August 2014, pp. 378-379
- Print publication: August 2014
-
- Article
-
- You have access
- Export citation
Overview of Commercially Available CEOS Hexapole-type Aberration Correctors
- Journal: Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press: 27 August 2014, pp. 934-935
- Print publication: August 2014
-
- Article
-
- You have access
- Export citation
Some Personal Memories of Otto Scherzer
- Journal: Microscopy Today / Volume 18 / Issue 4 / July 2010
- Published online by Cambridge University Press: 07 July 2010, pp. 34-37
- Print publication: July 2010
-
- Article
-
- You have access
- HTML
- Export citation
-
Design of an Electron Optical System for the Correction of the Chromatic Aberration Cc of a TEM Objective Lens
- Journal: Microscopy and Microanalysis / Volume 10 / Issue S03 / August 2004
- Published online by Cambridge University Press: 01 August 2004, pp. 2-3
- Print publication: August 2004
-
- Article
- Export citation
-
Cs Corrector for Imaging
- Journal: Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press: 01 August 2004, pp. 976-977
- Print publication: August 2004
-
- Article
- Export citation
-
Electron Holography with Cs-corrected TEM
- Journal: Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press: 01 August 2004, pp. 112-113
- Print publication: August 2004
-
- Article
- Export citation
-
Electron Holography with Cs-corrected TEM
- Journal: Microscopy and Microanalysis / Volume 10 / Issue S03 / August 2004
- Published online by Cambridge University Press: 01 August 2004, pp. 40-41
- Print publication: August 2004
-
- Article
- Export citation
-
Cs Corrector for Illumination
- Journal: Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press: 01 August 2004, pp. 1004-1005
- Print publication: August 2004
-
- Article
- Export citation
-
State of the First Aberration-Corrected, Monochromized 200kV FEG-TEM
- Journal: Microscopy and Microanalysis / Volume 9 / Issue S03 / September 2003
- Published online by Cambridge University Press: 05 September 2003, pp. 38-39
- Print publication: September 2003
-
- Article
- Export citation
Current and Future Developments in order to Approach a Point Resolution of dpr ~ 0.5 Å with a TEM
- Journal: Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press: 01 August 2003, pp. 930-931
- Print publication: August 2003
-
- Article
-
- You have access
- Export citation
State of the first aberration-corrected, monochromized 200kV FEG-TEM
- Journal: Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press: 16 July 2003, pp. 938-939
- Print publication: August 2003
-
- Article
-
- You have access
- Export citation
Experimental Set-up of a Purely Electrostatic Monochromator for High Resolution and Analytical Purposes of a 200 KV TEM
- Journal: Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press: 01 August 2002, pp. 584-585
- Print publication: August 2002
-
- Article
-
- You have access
- Export citation
Realization of a Field Emission Gun with Advanced Köhler Illumination
- Journal: Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press: 01 August 2002, pp. 486-487
- Print publication: August 2002
-
- Article
-
- You have access
- Export citation