The direct carbonate procedure for accelerator mass spectrometry radiocarbon (AMS 14C) dating of submilligram samples of biogenic carbonate without graphitization is becoming widely used in a variety of studies. We compare the results of 153 paired direct carbonate and standard graphite 14C determinations on single specimens of an assortment of biogenic carbonates. A reduced major axis regression shows a strong relationship between direct carbonate and graphite percent Modern Carbon (pMC) values (m = 0.996; 95% CI [0.991–1.001]). An analysis of differences and a 95% confidence interval on pMC values reveals that there is no significant difference between direct carbonate and graphite pMC values for 76% of analyzed specimens, although variation in direct carbonate pMC is underestimated. The difference between the two methods is typically within 2 pMC, with 61% of direct carbonate pMC measurements being higher than their paired graphite counterpart. Of the 36 specimens that did yield significant differences, all but three missed the 95% significance threshold by 1.2 pMC or less. These results show that direct carbonate 14C dating of biogenic carbonates is a cost-effective and efficient complement to standard graphite 14C dating.

YBCO films prepared from metal trifluoroacetate (TFA) precursors on oxide-buffered textured non-magnetic substrates have achieved performance levels equaling that on oxide buffered textured Ni substrates. Critical current densities of 0.7 MA/cm2 to 1.0 MA/cm2 have been achieved in 0.4 µm thick YBCO films on short-length of CeO2/YSZ/Y2O3/Ni/Ni-13wt%Cr substrates. High-quality epitaxial buffers comprising a Ni layer, Y2O3 seed, YSZ barrier and CeO2 cap layers have been deposited over meter long tapes of deformation textured Ni and Ni-13%Cr using reel-to-reel processes. High-performance TFA-based YBCO films have been deposited on 0.1 m to 0.3 m lengths of these oxide buffered substrates using reel to reel processes. Critical current densities up to 1.0 MA/cm2 have been achieved in 0.4 µm thick YBCO films on CeO2/YSZ/Y2O3/Ni substrates. Using multiple coats of the metal trifluoroacetate precursors, thicker YBCO films have been demonstrated on oxide buffered substrates. Critical currents in excess of 100A/cm-width have been achieved for 1.2 µm -1.6 µm thick YBCO films on short lengths of CeO2/YSZ/Y2O3/Ni substrates.

Sol-gel processing of La2Zr2O7 (LZO) buffer layers on biaxially textured Ni-3 at.% W alloy substrates using a continuous reel-to-reel dip-coating unit has been studied. The epitaxial LZO films obtained have a strong cube texture and uniform microstructure. The effect of increasing the annealing speed on the texture, microstructure and the carbon content retained in the film were studied. On top of the LZO films, epitaxial layers of Yttria Stabilized Zirconia (YSZ) and Ceria (CeO2) were deposited using rf sputtering, and YBa2Cu3Ox (YBCO) films were then deposited using Pulsed Laser Deposition (PLD). A critical current density (Jc) of 1.9 MA/cm2 at 77K and self-field and 0.34 MA/cm2 at 77K and 0.5T have been obtained on these films. These values are comparable to those obtained on YBCO films deposited on all-vacuum deposited buffer layers, and are the highest ever obtained using solution seed layers. The use of all-solution buffers for coated conductor processing has also been explored. A critical current density of 1.1 MA/cm2 at 77 K and self-field was obtained on YBCO films grown be PLD on LZO buffered nickel substrates.