50 results
Electron Image Reconstruction for Pixelated Semiconductor Tracking Detectors Based on Neural Networks
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 3040-3042
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- August 2022
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Silicon Drift Detectors in Electron Microscopy - An Over 20 Year History with a Bright Future
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 796-797
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- August 2018
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Towards a Direct Visualization of Charge Transfer in Monolayer Hexagonal Boron Nitride using a Fast Pixelated Detector in the Scanning Transmission Electron Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 436-437
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- July 2017
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Pushing the Limits of Fast Acquisition in TEM Tomography and 4D-STEM
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 512-513
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- July 2016
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Phase Imaging in STEM Allowing for Post-Acquisition Aberration Correction and 3D Optical Sectioning using Ptychography Wigner-Distribution Deconvolution
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 508-509
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- July 2016
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High Speed, High Resolution Imaging Spectrometers Based on pnCCDs for XRF and XRD Applications
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 100-101
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- July 2016
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New Opportunities with Oval-shaped Silicon Drift Detectors for High-Throughput EDX Analysis in Electron Microscopy
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 42-43
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- July 2016
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Electric and Magnetic Field Mapping With the pnCCD (S)TEM Camera
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 256-257
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- July 2016
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Novel Silicon Drift Detector Devices for Ultra-Fast, High-Resolution X-ray Spectroscopy
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 40-41
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- July 2016
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C05 Silicon Drift Detectors for High Resolution, High Count Rate X-ray Spectroscopy at Room Temperature
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- Powder Diffraction / Volume 18 / Issue 2 / June 2003
- Published online by Cambridge University Press:
- 20 May 2016, p. 175
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F-18 High Performance Silicon Drift Detectors with Integrated Fet for XRF Analysis
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- Powder Diffraction / Volume 22 / Issue 2 / June 2007
- Published online by Cambridge University Press:
- 20 May 2016, p. 178
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F25 Optimized Readout Methods of Silicon Drift Detectors for High Resolution, High Count Rate X-ray Spectroscopy
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- Powder Diffraction / Volume 20 / Issue 2 / June 2005
- Published online by Cambridge University Press:
- 20 May 2016, p. 185
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F23 Optimization of the peak-to-background ratio and the low energy response of silicon drift detectors for high resolution X-ray spectroscopy
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- Powder Diffraction / Volume 21 / Issue 2 / June 2006
- Published online by Cambridge University Press:
- 20 May 2016, p. 182
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F-64 Expanding the Detector Efficiency of Silicon Drift Detectors with Optimized Radiation Entrance Window
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- Powder Diffraction / Volume 23 / Issue 2 / June 2008
- Published online by Cambridge University Press:
- 20 May 2016, p. 173
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F-26 New Detector Architectures with Silicon Drift Detectors for XRF Applications
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- Powder Diffraction / Volume 24 / Issue 2 / June 2009
- Published online by Cambridge University Press:
- 20 May 2016, p. 164
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F-57 Excellent Performance with 100 mm2 Silicon Drift Detectors for X-rays and Gamma Radiation
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- Powder Diffraction / Volume 25 / Issue 2 / June 2010
- Published online by Cambridge University Press:
- 20 May 2016, p. 211
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F-9 Progress with Silicon Drift Detectors Used for High Resolution—High Count Rate X-ray Spectroscopy
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- Powder Diffraction / Volume 19 / Issue 2 / June 2004
- Published online by Cambridge University Press:
- 20 May 2016, p. 197
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F26 Large Area Silicon Drift Detectors for X-ray Spectroscopy
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- Powder Diffraction / Volume 20 / Issue 2 / June 2005
- Published online by Cambridge University Press:
- 20 May 2016, p. 185
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C04 State-of-the-Art Silicon Detectors for X-ray Spectroscopy
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- Powder Diffraction / Volume 18 / Issue 2 / June 2003
- Published online by Cambridge University Press:
- 20 May 2016, p. 174
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High Speed, High Throughput Two Dimensional Direct Electron Detector Based on the Concept of pnCCDs
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 392-393
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- August 2014
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