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Sample preparation for aberration-corrected microscopy of high-quality TEM specimens of advanced integrated circuits
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 150-151
- Print publication:
- August 2018
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Performance Characterization of Hitachi HD-2300A STEM with Dual-EDS Configuration
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 942-943
- Print publication:
- July 2010
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Imaging and Elemental Mapping of Biological Specimens with the Hitachi HD-2300A Dual-EDS Scanning Transmission Electron Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 884-885
- Print publication:
- July 2010
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