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Computationally Efficient Handling of Partially Coherent Electron Sources in (S)TEM Image Simulations via Matrix Diagonalization
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- Microscopy and Microanalysis , FirstView
- Published online by Cambridge University Press:
- 15 September 2022, pp. 1-9
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Integrated Differential Phase Contrast (IDPC)-STEM Utilizing a Multi-Sector Detector for Imaging Thick Samples
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- Microscopy and Microanalysis / Volume 28 / Issue 3 / June 2022
- Published online by Cambridge University Press:
- 07 March 2022, pp. 611-621
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- June 2022
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Engineering the Contrast Transfer through the Cc/Cs Corrected 20-80 kV SALVE Microscope
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 880-881
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- July 2016
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Experimental Contrast of Atomically-resolved Cc/Cs-corrected 20-80kVSALVEImages of 2D-objects Matches Calculations
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 894-895
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- July 2016
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Performance of the SALVE-microscope: Atomic-resolution TEM Imaging at 20 kV
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 878-879
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- July 2016
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Optical properties of defects in nitride semiconductors
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- Journal of Materials Research / Volume 30 / Issue 20 / 28 October 2015
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- 23 September 2015, pp. 2977-2990
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- 28 October 2015
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Improved Focused Ion Beam Target Preparation of (S)TEM Specimen—A Method for Obtaining Ultrathin Lamellae
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- Microscopy and Microanalysis / Volume 18 / Issue 2 / April 2012
- Published online by Cambridge University Press:
- 21 March 2012, pp. 379-384
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- April 2012
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Defects in hexagonal SiC analyzed by Molecular Dynamics and HRTEM image simulations
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- Microscopy and Microanalysis / Volume 9 / Issue S03 / September 2003
- Published online by Cambridge University Press:
- 05 September 2003, pp. 204-205
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- September 2003
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What determines the structure of GeSi nanocrystals embedded in polytypic SiC?
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- Microscopy and Microanalysis / Volume 9 / Issue S03 / September 2003
- Published online by Cambridge University Press:
- 05 September 2003, pp. 182-183
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- September 2003
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Considerations on the accuracy of lattice parameters determined from HRTEM images
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- Microscopy and Microanalysis / Volume 9 / Issue S03 / September 2003
- Published online by Cambridge University Press:
- 05 September 2003, pp. 166-167
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- September 2003
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