71 results
4D Analytical STEM with the pnCCD
-
- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 220-221
- Print publication:
- August 2018
-
- Article
-
- You have access
- Export citation
Silicon Drift Detectors in Electron Microscopy - An Over 20 Year History with a Bright Future
-
- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 796-797
- Print publication:
- August 2018
-
- Article
-
- You have access
- Export citation
Insights on Sample Topography in EDX Spectroscopy with Annular SDD Detectors
-
- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1144-1145
- Print publication:
- August 2018
-
- Article
-
- You have access
- Export citation
A Compact High Solid Angle EDX Detector System for SEM and TEM
-
- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 76-77
- Print publication:
- July 2017
-
- Article
-
- You have access
- Export citation
Towards a Direct Visualization of Charge Transfer in Monolayer Hexagonal Boron Nitride using a Fast Pixelated Detector in the Scanning Transmission Electron Microscope
-
- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 436-437
- Print publication:
- July 2017
-
- Article
-
- You have access
- Export citation
Flows along arch filaments observed in the GRIS ‘very fast spectroscopic mode’
-
- Journal:
- Proceedings of the International Astronomical Union / Volume 12 / Issue S327 / October 2016
- Published online by Cambridge University Press:
- 12 September 2017, pp. 28-33
- Print publication:
- October 2016
-
- Article
-
- You have access
- Export citation
Pushing the Limits of Fast Acquisition in TEM Tomography and 4D-STEM
-
- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 512-513
- Print publication:
- July 2016
-
- Article
-
- You have access
- Export citation
Phase Imaging in STEM Allowing for Post-Acquisition Aberration Correction and 3D Optical Sectioning using Ptychography Wigner-Distribution Deconvolution
-
- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 508-509
- Print publication:
- July 2016
-
- Article
-
- You have access
- Export citation
The Use of Electron Ptychography to Implement Efficient Phase Imaging in STEM
-
- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 466-467
- Print publication:
- July 2016
-
- Article
-
- You have access
- Export citation
High Speed, High Resolution Imaging Spectrometers Based on pnCCDs for XRF and XRD Applications
-
- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 100-101
- Print publication:
- July 2016
-
- Article
-
- You have access
- Export citation
New Opportunities with Oval-shaped Silicon Drift Detectors for High-Throughput EDX Analysis in Electron Microscopy
-
- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 42-43
- Print publication:
- July 2016
-
- Article
-
- You have access
- Export citation
How New Electron Detector Concepts Can Help to Increase Throughput and Sensitivity of Single-and Multi-Beam Scanning Electron Microscopes
-
- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 598-599
- Print publication:
- July 2016
-
- Article
-
- You have access
- Export citation
Electric and Magnetic Field Mapping With the pnCCD (S)TEM Camera
-
- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 256-257
- Print publication:
- July 2016
-
- Article
-
- You have access
- Export citation
Multivariate Statistical Analysis of Series of Diffraction Patterns
-
- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 482-483
- Print publication:
- July 2016
-
- Article
-
- You have access
- Export citation
Novel Silicon Drift Detector Devices for Ultra-Fast, High-Resolution X-ray Spectroscopy
-
- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 40-41
- Print publication:
- July 2016
-
- Article
-
- You have access
- Export citation
C05 Silicon Drift Detectors for High Resolution, High Count Rate X-ray Spectroscopy at Room Temperature
-
- Journal:
- Powder Diffraction / Volume 18 / Issue 2 / June 2003
- Published online by Cambridge University Press:
- 20 May 2016, p. 175
-
- Article
- Export citation
F-18 High Performance Silicon Drift Detectors with Integrated Fet for XRF Analysis
-
- Journal:
- Powder Diffraction / Volume 22 / Issue 2 / June 2007
- Published online by Cambridge University Press:
- 20 May 2016, p. 178
-
- Article
- Export citation
F25 Optimized Readout Methods of Silicon Drift Detectors for High Resolution, High Count Rate X-ray Spectroscopy
-
- Journal:
- Powder Diffraction / Volume 20 / Issue 2 / June 2005
- Published online by Cambridge University Press:
- 20 May 2016, p. 185
-
- Article
- Export citation
F23 Optimization of the peak-to-background ratio and the low energy response of silicon drift detectors for high resolution X-ray spectroscopy
-
- Journal:
- Powder Diffraction / Volume 21 / Issue 2 / June 2006
- Published online by Cambridge University Press:
- 20 May 2016, p. 182
-
- Article
- Export citation
F-64 Expanding the Detector Efficiency of Silicon Drift Detectors with Optimized Radiation Entrance Window
-
- Journal:
- Powder Diffraction / Volume 23 / Issue 2 / June 2008
- Published online by Cambridge University Press:
- 20 May 2016, p. 173
-
- Article
- Export citation