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Multivariate Statistical Analysis of Series of Diffraction Patterns

Published online by Cambridge University Press:  25 July 2016

P.G. Kotula ,
M.H. Van Benthem ,
H. Ryll ,
M. Simson  and
H. Soltau
P.G. Kotula
Affiliation:
Sandia National Laboratories, PO Box 5800, MS 0886, Albuquerque, NM 87185-0886, USA
M.H. Van Benthem
Affiliation:
Sandia National Laboratories, PO Box 5800, MS 0886, Albuquerque, NM 87185-0886, USA
H. Ryll
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 Munich, Germany
M. Simson
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, 81739 Munich, Germany
H. Soltau
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, 81739 Munich, Germany

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 482 - 483
Copyright
© Microscopy Society of America 2016 

References

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