10 results
Comparison of Cliff–Lorimer-Based Methods of Scanning Transmission Electron Microscopy (STEM) Quantitative X-Ray Microanalysis for Application to Silicon Oxycarbides Thin Films
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue 3 / June 2018
- Published online by Cambridge University Press:
- 31 May 2018, pp. 193-206
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- June 2018
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Holographic Generation of Highly Twisted Electron Beams
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
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- 23 September 2015, pp. 675-676
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- August 2015
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Electron holograms encoding amplitude and phase for the generation of arbitrary wavefunctions
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
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- 23 September 2015, pp. 503-504
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- August 2015
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Structured Electron Beam Illumination: A New Control Over the Electron Probe Weird Probes and New Experiments
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
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- 23 September 2015, pp. 25-26
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- August 2015
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Holograms for the Generation of Vortex States with L=500h Fabricated by Electron Beam Lithography
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
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- 23 September 2015, pp. 667-668
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- August 2015
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Experiments and Potentialities for the use of Bessel Beam in Superresolution STEM
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
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- 27 August 2014, pp. 384-385
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- August 2014
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Innovative Phase Plates for Beam Shaping
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
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- 27 August 2014, pp. 228-229
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- August 2014
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Quantitative X-Ray Microanalysis of Thin NiO Films by Monte Carlo and Cliff-Lorimer Methods
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- Microscopy Today / Volume 22 / Issue 2 / March 2014
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- 11 March 2014, pp. 28-35
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- March 2014
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FIB Preparation of a NiO Wedge-Lamella and STEM X-Ray Microanalysis for the Determination of the Experimental k(O-Ni) Cliff-Lorimer Coefficient
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- Microscopy and Microanalysis / Volume 19 / Issue 1 / February 2013
- Published online by Cambridge University Press:
- 03 January 2013, pp. 79-84
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- February 2013
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Ultra-low Voltage, Self-aligned OTFTs for Frequency Applications
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1567 / 2013
- Published online by Cambridge University Press:
- 21 May 2013, mrss13-1567-jj13-34
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- 2013
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