6 results
Single Atom Detection Through HAADF-STEM and EELS/EDX Characterization of Fluorophore Ru(bpy)32+ for Optical DNA-Chip Applications
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1429-1430
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- August 2015
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STEM and EELS study of the Graphene/Bi2Se3 Interface
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1151-1152
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- August 2015
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Atomic-Scale Analysis of Chemical Bonding of Delaminated Graphene at Faceted SiC by Aberration-Corrected Scanning Transmission Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1238-1239
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- August 2013
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Applications of Atomic Scale Scanning Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 134-135
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- August 2006
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Avoiding Charge Induced Drift In Vitrified Biological Specimens Through Scanning Transmission Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 246-247
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- August 2006
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Charging effects in Si quantum dots for Non Volatile Memories applications monitored by Electrostatic Force Microscopy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 794 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, T3.43
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- 2003
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