10 results
Electrical Test Sites for AMLCD-TFT Array Process Characterization
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- Journal:
- MRS Online Proceedings Library Archive / Volume 508 / January 1998
- Published online by Cambridge University Press:
- 10 February 2011, 79
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- January 1998
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In-Plane Crystallographic Texture of Bcc Metal thin films on Amorphous Substrates
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- Journal:
- MRS Online Proceedings Library Archive / Volume 472 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 27
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- 1997
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Activation energy for Pt2Si and PtSi formation measured over a wide range of ramp rates
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- Journal:
- Journal of Materials Research / Volume 10 / Issue 8 / August 1995
- Published online by Cambridge University Press:
- 03 March 2011, pp. 1953-1957
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- August 1995
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In-Situ Resistance Measurements During Rapid Thermal Annealing for Process Characterization
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- Journal:
- MRS Online Proceedings Library Archive / Volume 389 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 321
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- 1995
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Materials Issues in Copper Interconnections
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- Journal:
- MRS Bulletin / Volume 19 / Issue 8 / August 1994
- Published online by Cambridge University Press:
- 29 November 2013, pp. 23-29
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- August 1994
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Manufacturability Versus Reliability Issues Relevant to Interconnect Metallizations.
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- Journal:
- MRS Online Proceedings Library Archive / Volume 337 / 1994
- Published online by Cambridge University Press:
- 25 February 2011, 59
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- 1994
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The Effect of Annealing on the Cu Distribution and AI2Cu Precipitation in Ai(Cu) Thin Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 309 / 1993
- Published online by Cambridge University Press:
- 21 February 2011, 423
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- 1993
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Rapid Evaluation of Thin Film Interfacial Reactions Using Temperature-Ramped Measurements
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- Journal:
- MRS Online Proceedings Library Archive / Volume 318 / 1993
- Published online by Cambridge University Press:
- 21 February 2011, 307
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- 1993
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The effect of Cu on morphological instabilities in thin Al/Pt films
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- Journal:
- Journal of Materials Research / Volume 7 / Issue 5 / May 1992
- Published online by Cambridge University Press:
- 31 January 2011, pp. 1093-1095
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- May 1992
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Diffusion markers in thin-film VA13, Co2Al9, CrAl7, MoAl12, and Ni3Al formation
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- Journal:
- Journal of Materials Research / Volume 1 / Issue 6 / December 1986
- Published online by Cambridge University Press:
- 29 June 2016, pp. 786-791
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- December 1986
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