5 results
New Possibilities for State-of-the-Art Electron Microscopy with Fast Backscattered Electron Detectors
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 650-651
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- August 2018
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A Dedicated Backscattered Electron Detector for High Speed Imaging and Defect Inspection
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 10-11
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- July 2017
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Analysis of Polymorphs Using Simultaneous X-ray Fluorescence and Diffraction with an Imaging Spectrometer
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 102-103
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- July 2016
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Characterization and Comparison of Detector Systems for Large Area X-ray Imaging
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1637-1638
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- August 2015
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Setup and Practical Applications of a pnCCD Based XRF System
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 167-168
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- August 2015
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