7 results
Atom probe tomography of nanoscale electronic materials
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- Journal:
- MRS Bulletin / Volume 41 / Issue 1 / January 2016
- Published online by Cambridge University Press:
- 08 January 2016, pp. 30-34
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- January 2016
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Understanding Fayalite Chemistry using Electron Microscopy and Atom Probe Tomography
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 998-999
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- August 2014
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Mapping the Complex Phase Formation at the Surface of Supercritical CO Reacted Fayalite for Geologic Sequestration of Greenhouse Gases
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 976-977
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- August 2013
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Microscopic Characterization of Heterogeneous Catalysts in 3-D and In-situ/Ex-situ
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1662-1663
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- August 2013
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Mapping the Electrostatic Profile Across Axial p-n Junctions in Si nanowires using Off-Axis Electron Holography
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1826-1827
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- July 2012
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Controlling axial p-n heterojunction abruptness through catalyst alloying in vapor-liquid-solid grown semiconductor nanowires
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1860-1861
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- July 2012
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Characterization of embedded metallic nanoparticles in oxides by cross-coupling aberration-corrected STEM and Atom Probe Tomography
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 912-913
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- July 2012
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