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Mapping the Electrostatic Profile Across Axial p-n Junctions in Si nanowires using Off-Axis Electron Holography

  • Z. Gan (a1), D.J. Smith (a1), M.R. McCartney (a1), D.E. Perea (a2) and S.T. Picraux (a2)...

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

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Mapping the Electrostatic Profile Across Axial p-n Junctions in Si nanowires using Off-Axis Electron Holography

  • Z. Gan (a1), D.J. Smith (a1), M.R. McCartney (a1), D.E. Perea (a2) and S.T. Picraux (a2)...

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