9 results
Electronic Properties of TEM-Sculpted Structure in Graphene
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1940-1941
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- August 2013
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Atom Probe Tomography Study of In-Doped ZnO
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1030-1031
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- August 2013
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Microencapsulation Method for Atom Probe Analysis of Powders
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 954-955
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- August 2013
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Application of Low Voltage Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1208-1209
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- August 2013
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Monochromated Low-Voltage Aberration-Corrected TEM for Imaging the Soft/Hard Materials Interface
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1616-1617
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- July 2012
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Topological Graphene Imaging and Fabrication of Devices
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1534-1535
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- July 2012
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Channeling Contrast in Helium Ion Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 696-697
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- July 2012
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The Parkes Multibeam Pulsar Survey Data Release
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- Journal:
- International Astronomical Union Colloquium / Volume 177 / 2000
- Published online by Cambridge University Press:
- 12 April 2016, pp. 9-10
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- 2000
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Sub-Millimetre Observations Of SiCC in IRC 10216
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- Journal:
- Symposium - International Astronomical Union / Volume 150 / 1992
- Published online by Cambridge University Press:
- 07 August 2017, pp. 399-400
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- 1992
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