11 results
Reference diffraction patterns, microstructure, and pore-size distribution for the copper (II) benzene-1,3,5-tricarboxylate metal organic framework (Cu-BTC) compounds – CORRIGENDUM
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- Journal:
- Powder Diffraction / Volume 30 / Issue 3 / September 2015
- Published online by Cambridge University Press:
- 07 May 2015, p. 323
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Three-dimensional Arrangement of Rare-earth Atoms at Grain Boundaries in Silicon Nitride Ceramics Using Aberration-Corrected HAADF-STEM
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 206-207
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- August 2005
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A New Double-Corrected HREM/STEM and its Applications for Advanced Materials
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- Microscopy and Microanalysis / Volume 10 / Issue S03 / August 2004
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- 01 August 2004, pp. 8-9
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- August 2004
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Cs Corrector for Imaging
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- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
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- 01 August 2004, pp. 976-977
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- August 2004
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Cs Corrector for Illumination
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- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 1004-1005
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- August 2004
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Strain Relaxation Mechanisms in Coherent and Incoherent Ge(Si)/Si Islands
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- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 22 July 2003, pp. 472-473
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- August 2003
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TEM Investigations of the Compositions in Ge(Si)/Si(001) Quantum Dots
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- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 19 July 2003, pp. 426-427
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- August 2003
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Al Compositional Profile In Algaas/Gaas Quantum Wells
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- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
- Published online by Cambridge University Press:
- 02 July 2020, pp. 168-169
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- August 1999
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Characterisation of Amorphous Materials By Electron Diffraction and Atomistic Modelling
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- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
- Published online by Cambridge University Press:
- 02 July 2020, pp. 684-685
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- August 1999
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Transmission Electron Microscopy Study of Ingaas/Gaas Structural Evolution Near the Stranski-Krastanow Transformation
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- MRS Online Proceedings Library Archive / Volume 570 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 175
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- 1999
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The Effect Of Ion-Implantation Induced Defects On Strain Relaxation In GexSi1−x/Si Heterostuctures
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- MRS Online Proceedings Library Archive / Volume 442 / 1996
- Published online by Cambridge University Press:
- 15 February 2011, 367
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- 1996
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