7 results
Can a Programmable Phase Plate Serve as an Aberration Corrector in the Transmission Electron Microscope (TEM)?
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- Journal:
- Microscopy and Microanalysis , FirstView
- Published online by Cambridge University Press:
- 05 September 2022, pp. 1-10
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Reaching for atomic-scale quantitative energy dispersive X-ray spectroscopy
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 2602-2603
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- August 2021
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Fast electron low dose tomography for beam sensitive materials
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 2116-2118
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- August 2021
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Optimizing Experimental Conditions for Accurate Quantitative Energy-Dispersive X-ray Analysis of Interfaces at the Atomic Scale
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- Microscopy and Microanalysis / Volume 27 / Issue 3 / June 2021
- Published online by Cambridge University Press:
- 12 April 2021, pp. 528-542
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- June 2021
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Quantification of 3D Atomic Structures and Their Dynamics by Atom-Counting from an ADF STEM Image
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1808-1809
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- August 2019
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Measurement of Atomic Electric Fields by Scanning Transmission Electron Microscopy (STEM) Employing Ultrafast Detectors
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 484-485
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- July 2016
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Getting the Best from an Imperfect Detector - an Alternative Normalisation Procedure for Quantitative HAADF STEM
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 126-127
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- August 2014
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