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Growth Dynamics, Stacking Sequence and Interlayer Coupling in Few-Layer Graphene Revealed by in Situ SEM
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1746-1747
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- July 2017
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Quantum Monte Carlo Simulation for Atomic Resolution SEM/STEM Image
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 30-31
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- August 2014
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Model-Based Library for Critical Dimension Metrology by CD-SEM
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 6-7
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- August 2014
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Progress in ICF programs at CAEP
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- Journal:
- Laser and Particle Beams / Volume 23 / Issue 3 / September 2005
- Published online by Cambridge University Press:
- 30 August 2005, p. 397
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Progress in ICF programs at CAEP
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- Journal:
- Laser and Particle Beams / Volume 23 / Issue 2 / June 2005
- Published online by Cambridge University Press:
- 07 June 2005, pp. 205-209
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