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Focused Ion Beam (FIB) based Tomography of Dislocations Using Electron Channeling Contrast Imaging (ECCI)
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 572-573
- Print publication:
- July 2017
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- Article
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