4 results
Self-Organized Topologies Above & Below Surfaces by FIB: From NanoWave & Surface Defect Motion, to Taking Re out of Redep, to Quantized Picostructures
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 598-599
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- August 2007
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Role of Planar Defects in Compound Semiconductor Crystals: From Growth of Nanomasts & Nanosails to Processing Light Emission in DualBeam FIB/SEM
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 722-723
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- August 2007
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Surface Rippling & Ion Etch Yields of Diamond Using a Focused Ion Beam: With or without Enhanced-Chemistry, Aspect Ratio Regulates Ion Etching
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1304-1305
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- August 2006
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Cryo FIB Applications: Metallographic Etching of Biological Materials; Cryolithography with Ice as an Environmentally Friendly Photoresist
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1268-1269
- Print publication:
- August 2006
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