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Modeling Electron Diffraction and Imaging in Microscopes with Aberration Correctors for Quantitative Materials Structural Analysis
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 920-921
- Print publication:
- August 2008
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- Article
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