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Certified Reference Material for Strain Measurement Using EBSD
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1895-1896
- Print publication:
- August 2015
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- Article
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Excellent Agreement Between High Resolution EBSD and XRD Strain Measurements on Si1-xGex films on Si
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 690-691
- Print publication:
- August 2013
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- Article
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- You have access
- Export citation