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Monitoring the Conductivity of Thin Metal Layers During the Processes of Grain-growth and Dewetting, Using a Desktop FEG-SEM
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1456-1457
- Print publication:
- August 2020
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- Article
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