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Revealing the Dopant Incorporation Mechanisms into Vapor-Liquid-Solid Grown NWs Employing Nano-Prope Scanning Auger Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 2090-2091
- Print publication:
- August 2014
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- Article
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Direct Measurement of Inhomogeneous Longitudinal Dopant Distribution in SiNWs Using Nano-Probe Scanning Auger Microscopy.
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1349 / 2011
- Published online by Cambridge University Press:
- 20 September 2011, mrss11-1349-dd08-05
- Print publication:
- 2011
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- Article
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