7 results
Multivariate Analysis and Compressed Sensing Methods for Spectroscopic Electron Tomography of Semiconductor Devices
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 500-501
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- August 2018
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Inpainting Versus Denoising for Dose Reduction in STEM
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 482-483
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- August 2018
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Correlative HAADF-STEM and EDX-STEM Tomography for the 3D Morphological and Elemental Analysis of FinFET Semiconductor Devices
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 388-389
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- August 2018
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Improved Three-Dimensional (3D) Resolution of Electron Tomograms Using Robust Mathematical Data-Processing Techniques
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- Microscopy and Microanalysis / Volume 23 / Issue 6 / December 2017
- Published online by Cambridge University Press:
- 16 November 2017, pp. 1121-1129
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- December 2017
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New Discrete Tomographic Reconstruction Method for Electron Tomography
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 2331-2332
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- August 2015
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Robust Physical Alignment Models for Electron Tomography
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 2335-2336
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- August 2015
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Advanced 3-D Reconstruction Algorithms for Electron Tomography
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 794-795
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- August 2014
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