4 results
Annular Dark-Field Imaging of Atomic Substitution in Single-Layer Materials
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 74-75
- Print publication:
- July 2010
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Interface Structure-Property Relations Through Aberration-Corrected STEM
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1420-1421
- Print publication:
- July 2010
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Strain-Enhanced Ionic Conductivity
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 100-101
- Print publication:
- July 2010
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Processing and Aberration-Corrected Imaging of Novel Low-Dimensional Nanostructures
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 76-77
- Print publication:
- July 2010
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