5 results
Microstructure and Electrical Properties of III-As Gate Stacks with Amorphous Rare-Earth High-k Oxides
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1412-1413
- Print publication:
- July 2010
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ZnO Epitaxy on (111) Silicon Using Intervening Bixbyite Oxide Buffer Layers
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1402-1403
- Print publication:
- July 2010
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Atomic Scale Compositions Across DyScO3/SrTiO3 Interfaces
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1012-1013
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- July 2009
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Structure and electronic properties of scandate/titanate multilayers determined by high-resolution TEM/STEM and EELS
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S03 / September 2007
- Published online by Cambridge University Press:
- 07 September 2007, pp. 368-369
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- September 2007
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Preparation and Characterization of Rare Rarth Scandate Thin Films as an Alternative gate dielectric
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- Journal:
- MRS Online Proceedings Library Archive / Volume 917 / 2006
- Published online by Cambridge University Press:
- 01 February 2011, 0917-E05-10
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- 2006
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