7 results
Focused Ion Beam Preparation of Low Melting Point Metals: Lessons Learned from Pb/Sn Solders
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 10-12
- Print publication:
- August 2022
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Building In-situ Diamond Anvil Cell Sample Assemblies with Xe PFIB
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 68-69
- Print publication:
- August 2022
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Using Xe Plasma FIB for High-Quality TEM Sample Preparation
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue 3 / June 2022
- Published online by Cambridge University Press:
- 15 March 2022, pp. 646-658
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- June 2022
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Expanding the Capability of Xe Plasma Focused Ion Beam Sample Preparation for Transmission Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 218-219
- Print publication:
- August 2021
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Three-dimensional Analysis of Materials at Multiple Length Scales
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1680-1682
- Print publication:
- August 2020
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Semi-Inverted Sample Preparation of Meteorites for High Resolution Analytical Electron Microscopy Using Correlative Raman Spectroscopy and Xe Plasma FIB
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 894-895
- Print publication:
- August 2019
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Site Specific Preparation of Powders for High-Resolution Analytical Electron Microscopy Using a Ga+ Focused Ion Beam
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 180-181
- Print publication:
- July 2016
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