It is my pleasure to welcome you to Microscopy and Microanalysis
2002, jointly sponsored by the Microscopy Society of America,
Microbeam Analysis Society, Microscopy Society of
Canada/Société de Microscopie du Canada, and the
International Metallographic Society. An excellent program with
an outstanding list of invited speakers for symposia has been
assembled by the Program Committee consisting of the Chair,
Edgar Voelkl, and Co-Chairs, David Piston (MSA), Raynald Gauvin
(MAS/MSC), and Allan Lockley (IMS). Highlights of Microscopy
and Microanalysis 2002 include the world's largest display
of microscopes and related technologies together with outstanding
sessions on all aspects of microscopy and microanalysis. Symposia
will be held on 3-D electron microscopy of macromolecules and
cryo-electron microscopy of macromolecules, the quantitative
aspects of X-ray microscopy, confocal microscopy, biomaterials,
biological and materials specimen preparation. Special sessions
will be held on holography, phase imaging, deep tissue imaging,
(S)TEM instrumentation, developments in focused-ion beam
instruments and imaging, metallographic specimen preparation
from start to finish, and the changing role of atom probe
microscopes in the nanotechnology era. Advances in immunolabeling,
EELS, and detectors for X-ray microanalysis also will be presented.
A special analytical electron microscopy session honoring the
work of Elmar Zeitler is also scheduled. A pre-meetingworkshop
“Future of Materials Characterization of Charging
Materialsusing Microbeam Analysis” organized by Dr. Raynald
Gauvin will be held at McGill University in Montreal on August
2–3. The Local Arrangements Committee, headed by Pierre
Charest, has coordinated the scheduling of many local events
to complement the meeting.