9 results
Nanostructural Characterization of CdTe Thin Film Photovoltaics Using Electron Backscatter Diffraction
-
- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1352-1353
- Print publication:
- July 2010
-
- Article
-
- You have access
- Export citation
Methods of Evaluating EBSD Sample Preparation
-
- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 780-781
- Print publication:
- July 2009
-
- Article
-
- You have access
- Export citation
In-Situ Orientation Imaging of Recrystallization and Grain Growth in OFHC Copper
-
- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 678-679
- Print publication:
- July 2009
-
- Article
-
- You have access
- Export citation
EBSD Analysis of Strain
-
- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 178-179
- Print publication:
- July 2009
-
- Article
-
- You have access
- Export citation
Interactive EBSD Based Analysis of a Fatigue Crack in a Nickel Superalloy
-
- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 418-419
- Print publication:
- July 2009
-
- Article
-
- You have access
- Export citation
Determination of Crystal Structure from Electron Backscatter Diffraction Patterns
-
- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 766-767
- Print publication:
- July 2009
-
- Article
-
- You have access
- Export citation
Microstructural Analysis of CdTe Thin Films using EBSD and FIB
-
- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1390-1391
- Print publication:
- July 2009
-
- Article
-
- You have access
- Export citation
A Review of In-Situ Electron Backscattered Diffraction Observations of Dynamic Processes
-
- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 914-915
- Print publication:
- August 2007
-
- Article
- Export citation
Impact of the Third Dimension on EBSD Characterizations of Residual Strain
-
- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 924-925
- Print publication:
- August 2006
-
- Article
-
- You have access
- Export citation