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Analysis of Local Texture across Layers in Electron-Beam Melted (EBM) Ti-6Al- 4V via Electron Backscatter Diffraction (EBSD)
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 702-703
- Print publication:
- July 2010
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- Article
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Sample Preparation Considerations for Electron Microscopy Characterization of Nano-Materials
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 382-383
- Print publication:
- August 2008
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